Vol. 2, 2017

Original research papers

Radiation Effects

BEHAVIOR OF MODERN INTEGRATED CIRCUITS AFTER LATCH-UP PARRYING

P. K. Skorobogatov, G. G. Davydov, A. A. Pechenkin, D. V. Boychenko

Pages: 159-162

DOI: 10.21175/RadProc.2017.32

The work is devoted to the research of the single and multiple latch-up impact on the subsequent behavior of electrical parameters and operability of modern integrated circuits. The impact of interrupted SEL amount on subsequent behavior of IC is introduced. An approach to the estimation of the maximum time in the latch-up state is formulated to ensure IC’s fault-free operation after SEL.
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